Please use this identifier to cite or link to this item: https://doi.org/10.1007/s00339-007-3968-y
Title: Highly (100) oriented Pb(Zr0.52Ti0.48)O 3/LaNiO3 films grown on amorphous substrates by pulsed laser deposition
Authors: Yu, Y.H.
Lai, M.O. 
Lu, L. 
Issue Date: Aug-2007
Citation: Yu, Y.H., Lai, M.O., Lu, L. (2007-08). Highly (100) oriented Pb(Zr0.52Ti0.48)O 3/LaNiO3 films grown on amorphous substrates by pulsed laser deposition. Applied Physics A: Materials Science and Processing 88 (2) : 365-370. ScholarBank@NUS Repository. https://doi.org/10.1007/s00339-007-3968-y
Abstract: Pb(Zr0.52Ti0.48)O3 (PZT)/LaNiO3 (LNO) thin films with highly (100) out of plane orientation were produced on SiO2/Si(100) and alkaline earth aluminosilicate glass substrates by pulsed laser deposition (PLD). Orientations of both PZT and LNO films were evaluated using X-ray diffraction. The pure (100)-oriented PZT/LNO films were obtained under optimized deposition conditions. Time of flight-secondary ion mass spectrometry analysis showed that LNO could effectively block interdiffusion between the PZT films and the substrates. Fairly smooth surfaces of the PZT films with roughness of about 4 nm were observed using an atomic force microscope. Cross sectional examination revealed that the films grew in columnar grains. The PZT films grown on both SiO2/Si and glass substrates demonstrated very good ferroelectric characteristic at room temperature with remnant polarization of up to 26 μC/cm2. © Springer-Verlag 2007.
Source Title: Applied Physics A: Materials Science and Processing
URI: http://scholarbank.nus.edu.sg/handle/10635/85270
ISSN: 09478396
DOI: 10.1007/s00339-007-3968-y
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