Please use this identifier to cite or link to this item: https://doi.org/10.1007/s00339-003-2379-y
Title: Growth and characterization of (001)-oriented Pb(Zr0.52Ti 0.48)O3/LaNiO3/LaAlO3 heterostructures prepared by pulsed laser deposition
Authors: Zhu, T.J. 
Lu, L. 
Issue Date: Apr-2005
Citation: Zhu, T.J., Lu, L. (2005-04). Growth and characterization of (001)-oriented Pb(Zr0.52Ti 0.48)O3/LaNiO3/LaAlO3 heterostructures prepared by pulsed laser deposition. Applied Physics A: Materials Science and Processing 80 (7) : 1517-1522. ScholarBank@NUS Repository. https://doi.org/10.1007/s00339-003-2379-y
Abstract: Completely (001)-oriented ferroelectric Pb(Zr0.52Ti 0.48)O3/LaNiO3 heterostructures on single-crystal LaAlO3(001) substrates have been successfully grown by pulsed laser deposition. X-ray-diffraction analyses (θ-2θ scan, ω scan and φ scan) indicate that good out-of-plane orientation and in-plane alignment have been obtained with the epitaxial relationship of PZT(001)//LNO(001)//LAO(001) and PZT〈001〉//LNO〈001〉// LAO〈001〉. Scanning electron and atomic force microscopic images reveal very smooth LNO surfaces with roughness of about 0.4-0.6 nm. Based on a microstructural study of the LNO and PZT films, a layer-by-layer growth mode for the LNO growth is proposed, while island growth is dominant for the PZT films. Secondary ion mass spectroscopy analyses show that no distinct interdiffusion can be found between the PZT and LNO layers. P-E hysteresis loop measurements of the PZT films with LNO as bottom electrodes and Au as top electrodes were carried out at an applied voltage of 5 V. The best remanent polarization P r and coercive field Ec were found to be 28 μC/cm 2 and 74.5 kV/cm, respectively. © Springer-Verlag 2005.
Source Title: Applied Physics A: Materials Science and Processing
URI: http://scholarbank.nus.edu.sg/handle/10635/85249
ISSN: 09478396
DOI: 10.1007/s00339-003-2379-y
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