Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.3309419
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dc.titleEnhanced tunable and pyroelectric properties of Ba(Ti0.85Sn 0.15)O3 thin films with Bi1.5Zn 1.0Nb1.5O7 buffer layers
dc.contributor.authorWang, S.J.
dc.contributor.authorMiao, S.
dc.contributor.authorReaney, I.M.
dc.contributor.authorLai, M.O.
dc.contributor.authorLu, L.
dc.date.accessioned2014-10-07T09:04:34Z
dc.date.available2014-10-07T09:04:34Z
dc.date.issued2010
dc.identifier.citationWang, S.J., Miao, S., Reaney, I.M., Lai, M.O., Lu, L. (2010). Enhanced tunable and pyroelectric properties of Ba(Ti0.85Sn 0.15)O3 thin films with Bi1.5Zn 1.0Nb1.5O7 buffer layers. Applied Physics Letters 96 (8) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3309419
dc.identifier.issn00036951
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/85147
dc.description.abstractBi1.5Zn1.0Nb1.5O7 (BZN) buffered Ba(Ti0.85Sn0.15)O3 (BTS) heterostructures have been deposited on LaNiO3/SiO2/Si substrates by pulsed laser deposition. The film and interface microstructures, dielectric and pyroelectric properties of BTS thin films are controlled by the thickness of the BZN buffer layer. The BZN layer suppresses interdiffusion between BTS and the bottom electrode, resulting in a reduction in dielectric loss and leakage current. At 303 K, the dielectric loss, tunability and figure of merit of BZN buffered-BTS films are 0.009, 47.9%, and 68.4, respectively. Furthermore, a promising pyroelectric coefficient and figure of merit, 24.7× 10-4 C/ m2 K and 16.3× 10-5 Pa-1/2 are also attained at 293 K. © 2010 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.3309419
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentMECHANICAL ENGINEERING
dc.description.doi10.1063/1.3309419
dc.description.sourcetitleApplied Physics Letters
dc.description.volume96
dc.description.issue8
dc.description.page-
dc.description.codenAPPLA
dc.identifier.isiut000275027200061
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