Please use this identifier to cite or link to this item:
https://scholarbank.nus.edu.sg/handle/10635/84402
DC Field | Value | |
---|---|---|
dc.title | Erratum: Micro-Raman investigation of strain in GaN and AlxGa1-xN/GaN heterostructures grown on Si(111) (Journal of Applied Physics (2002) 92 (3503)) | |
dc.contributor.author | Tripathy, S. | |
dc.contributor.author | Chua, S.J. | |
dc.contributor.author | Chen, P. | |
dc.contributor.author | Miao, Z.L. | |
dc.date.accessioned | 2014-10-07T04:52:16Z | |
dc.date.available | 2014-10-07T04:52:16Z | |
dc.date.issued | 2003-01-01 | |
dc.identifier.citation | Tripathy, S.,Chua, S.J.,Chen, P.,Miao, Z.L. (2003-01-01). Erratum: Micro-Raman investigation of strain in GaN and AlxGa1-xN/GaN heterostructures grown on Si(111) (Journal of Applied Physics (2002) 92 (3503)). Journal of Applied Physics 93 (1) : 789-. ScholarBank@NUS Repository. | |
dc.identifier.issn | 00218979 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/84402 | |
dc.source | Scopus | |
dc.type | Others | |
dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
dc.description.sourcetitle | Journal of Applied Physics | |
dc.description.volume | 93 | |
dc.description.issue | 1 | |
dc.description.page | 789- | |
dc.description.coden | JAPIA | |
dc.identifier.isiut | NOT_IN_WOS | |
Appears in Collections: | Staff Publications |
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