Please use this identifier to cite or link to this item: https://doi.org/10.1109/PVSC.2008.4922509
Title: Thin-film poly-SI solar cells on AIT-textured glass - Importance of the rear reflector
Authors: Widenborg, P.I.
Chan, S.V.
Walsh, T.
Aberle, A.G. 
Issue Date: 2008
Citation: Widenborg, P.I.,Chan, S.V.,Walsh, T.,Aberle, A.G. (2008). Thin-film poly-SI solar cells on AIT-textured glass - Importance of the rear reflector. Conference Record of the IEEE Photovoltaic Specialists Conference : -. ScholarBank@NUS Repository. https://doi.org/10.1109/PVSC.2008.4922509
Abstract: EQE measurements were performed on thin-film poly-Si solar cells fabricated by the solid phase crystallisation method of PECVD a-Si:H (PLASMA cells). PC1D simulation showed that a SiO2/aluminium rear reflector is superior to an aluminium reflector. A promising Jsc.EQE value of 23 mA/cm2 has been obtained for a 3 microns thick PLASMA poly-Si solar cell on Aluminium-Induced Texture (AIT) textured glass having a SiO2/ aluminium rear reflector. © 2008 IEEE.
Source Title: Conference Record of the IEEE Photovoltaic Specialists Conference
URI: http://scholarbank.nus.edu.sg/handle/10635/84305
ISBN: 9781424416417
ISSN: 01608371
DOI: 10.1109/PVSC.2008.4922509
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