Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.jcrysgro.2004.04.099
Title: Nanoscale cube-on-cube growth and characterization of SrS:Eu, Sm optical memory material
Authors: Teo, K.L. 
Chen, C.
Chong, T.C. 
Keywords: A1. Reflection high energy electron diffraction
A3. Molecular beam epitaxy
B1. Sulfides
B2. Semiconducting II-VI materials
Issue Date: 1-Aug-2004
Citation: Teo, K.L., Chen, C., Chong, T.C. (2004-08-01). Nanoscale cube-on-cube growth and characterization of SrS:Eu, Sm optical memory material. Journal of Crystal Growth 268 (3-4 SPEC. ISS.) : 602-606. ScholarBank@NUS Repository. https://doi.org/10.1016/j.jcrysgro.2004.04.099
Abstract: We report the growth and characterization of SrS codoped with europium and samarium ions. The material was grown on (001) MgO substrate, using solid-source molecular-beam epitaxy technique. We show that the film epitaxial planes conserved the substrate surface symmetry - cubic. X-ray diffraction results establish the epitaxial relationship as cube-on-cube (001) SrS
(001)MgO with [100]SrS
[100] MgO for growth temperature between 400°C and 600°C. Infrared-stimulated luminescence with a peak at 612nm is observed at room temperature in SrS: Eu, Sm which is stimulated with infrared light after irradiation with visible light. © 2004 Elsevier B.V. All rights reserved.
Source Title: Journal of Crystal Growth
URI: http://scholarbank.nus.edu.sg/handle/10635/83999
ISSN: 00220248
DOI: 10.1016/j.jcrysgro.2004.04.099
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