Please use this identifier to cite or link to this item: https://doi.org/10.1109/FPL.2013.6645498
Title: Improving autonomous soft-error tolerance of FPGA through LUT configuration bit manipulation
Authors: Das, A.
Venkataraman, S.
Kumar, A. 
Issue Date: 2013
Source: Das, A.,Venkataraman, S.,Kumar, A. (2013). Improving autonomous soft-error tolerance of FPGA through LUT configuration bit manipulation. 2013 23rd International Conference on Field Programmable Logic and Applications, FPL 2013 - Proceedings : -. ScholarBank@NUS Repository. https://doi.org/10.1109/FPL.2013.6645498
Abstract: Soft-errors in LUT configuration bits of FPGAs can alter the functionality of an implemented design, rendering it useless, unless re-programmed. This paper proposes a technique to improve autonomous fault-masking capabilities of a design by maximizing the number of zeros or ones in LUTs. The technique utilizes spare resources (XOR gates and carry chain) of FPGA devices to selectively manipulate LUT contents using two operations - LUT restructuring and LUT decomposition. Experiments conducted with a wide set of benchmarks from MCNC, IWLS 2005 and ITC99 benchmark suite on Xilinx Virtex 6 FPGA board demonstrate that the proposed methodology maximizes logic 0/1 of LUTs by an average 20% achieving 80% fault-masking with no area overhead. The fault-rate of the entire design is reduced by 60% on average as compared to the existing techniques. Further, an additional 5% fault-masking can be achieved with a 7% increase in slice usage. © 2013 IEEE.
Source Title: 2013 23rd International Conference on Field Programmable Logic and Applications, FPL 2013 - Proceedings
URI: http://scholarbank.nus.edu.sg/handle/10635/83835
DOI: 10.1109/FPL.2013.6645498
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