Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/83430
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dc.titleA tunable and program-erasable capacitor on Si with excellent tuning memory
dc.contributor.authorLai, C.H.
dc.contributor.authorLee, C.F.
dc.contributor.authorChin, A.
dc.contributor.authorZhu, C.
dc.contributor.authorLi, M.F.
dc.contributor.authorMcAlister, S.P.
dc.contributor.authorKwong, D.L.
dc.date.accessioned2014-10-07T04:41:09Z
dc.date.available2014-10-07T04:41:09Z
dc.date.issued2004
dc.identifier.citationLai, C.H.,Lee, C.F.,Chin, A.,Zhu, C.,Li, M.F.,McAlister, S.P.,Kwong, D.L. (2004). A tunable and program-erasable capacitor on Si with excellent tuning memory. IEEE Radio Frequency Integrated Circuits Symposium, RFIC, Digest of Technical Papers : 259-262. ScholarBank@NUS Repository.
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/83430
dc.description.abstractA novel tunable and program-erasable high-κ AIN MIS capacitor is demonstrated for the first time with excellent tuning memory, which is useful to tune the impedance mismatching and resonance frequency without always connected voltage bias circuit. Large C max/C min tunability of 12 is obtained due to the high-κ AIN dielectric with high 5 πF/πm 2 capacitance density. Good tuning memory is evidenced from the small V th variation after program or erase at +4 V or -4 V for 10,000 s and the potential of years long extrapolated memory time.
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.sourcetitleIEEE Radio Frequency Integrated Circuits Symposium, RFIC, Digest of Technical Papers
dc.description.page259-262
dc.identifier.isiutNOT_IN_WOS
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