Please use this identifier to cite or link to this item:
|Title:||A robust and production worthy addressable array architecture for deep sub-micron MOSFET's matching characterization|
|Citation:||Yeo, S.B.,Bordelon, J.,Chu, S.,Li, M.F.,Tranchina, B.A.,Harward, M.,Chan, L.H.,See, A. (2002). A robust and production worthy addressable array architecture for deep sub-micron MOSFET's matching characterization. IEEE International Conference on Microelectronic Test Structures : 229-234. ScholarBank@NUS Repository.|
|Abstract:||A robust addressable array test structure is presented, which allows automated characterization of the MOSFET's matching, with high area and time efficiency, accuracy and repeatability. It features CMOS switches to ensure a full test operation range, and prevent gate oxide breakdown of individual DUTs from destroying the functionality of the whole test structure. The test structure provides superior isolation to minimize cross talk while providing greater flexibility in testing. Testing result (Id mismatch) on wafers of 0.18μm Technology will be presented.|
|Source Title:||IEEE International Conference on Microelectronic Test Structures|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Dec 28, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.