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https://doi.org/10.1063/1.2430652
DC Field | Value | |
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dc.title | Sc modified multiferroic BiFeO3 thin films prepared through a sol-gel process | |
dc.contributor.author | Shannigrahi, S.R. | |
dc.contributor.author | Huang, A. | |
dc.contributor.author | Chandrasekhar, N. | |
dc.contributor.author | Tripathy, D. | |
dc.contributor.author | Adeyeye, A.O. | |
dc.date.accessioned | 2014-10-07T04:35:58Z | |
dc.date.available | 2014-10-07T04:35:58Z | |
dc.date.issued | 2007 | |
dc.identifier.citation | Shannigrahi, S.R., Huang, A., Chandrasekhar, N., Tripathy, D., Adeyeye, A.O. (2007). Sc modified multiferroic BiFeO3 thin films prepared through a sol-gel process. Applied Physics Letters 90 (2) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2430652 | |
dc.identifier.issn | 00036951 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/82994 | |
dc.description.abstract | Multiferroic thin films with the general formula Bi Fe1-x Scx O3 (x=0.0, 0.1, 0.3, and 0.5 mol %) (BFS) were synthesized on PtTiSi O2 Si substrates through a sol-gel deposition method. From the x-ray diffraction (XRD) analysis, it was observed that the unit cell volume increased upon Sc doping up to 0.3 mol %. Impure phase appeared for the BFS (Sc: 0.5 mol %) films. Leakage current, ferroelectric, and magnetic properties were also found to improve for Sc doping up to 0.3 mol %. Room temperature magnetic coercive field for in-plane orientation of films showed the lowest value for BFS (Sc: 0.3 mol %) films, which indicates that BFS (Sc: 0.3 mol %) films were more magnetically soft. Room temperature value of the magnetodielectric effect in the presence of magnetic field of 8 kOe was found to have maximum of 3.36% for the BFS (Sc: 0.3 mol %) films. From the x-ray photoelectron spectroscopy measurements, it was observed that the Fe has mixed valency states of 2+ and 3+. The ratio of Fe2+ and Fe3+ was found to decrease slightly in BFS (Sc: 0.3 mol %) films. The improved leakage current and M-H loops support the authors' observation. © 2007 American Institute of Physics. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.2430652 | |
dc.source | Scopus | |
dc.type | Article | |
dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
dc.description.doi | 10.1063/1.2430652 | |
dc.description.sourcetitle | Applied Physics Letters | |
dc.description.volume | 90 | |
dc.description.issue | 2 | |
dc.description.page | - | |
dc.description.coden | APPLA | |
dc.identifier.isiut | 000243582000053 | |
Appears in Collections: | Staff Publications |
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