Please use this identifier to cite or link to this item:
|Title:||Quasi-two-dimensional transmission line model (QTD-TLM) for planar ohmic contact studies|
|Authors:||Chor, E.F. |
Specific contact resistance
|Citation:||Chor, E.F., Lerdworatawee, J. (2002-01). Quasi-two-dimensional transmission line model (QTD-TLM) for planar ohmic contact studies. IEEE Transactions on Electron Devices 49 (1) : 105-111. ScholarBank@NUS Repository. https://doi.org/10.1109/16.974756|
|Abstract:||An analytical quasi-two-dimensional transmission line model (QTD-TLM) has been formulated to more accurately extract the specific contact resistance (ρ c) of ohmic contacts than the conventional one-dimensional TLM (1D-TLM). Similar to 1D-TLM, the extraction of ρ c using QTD-TLD is straightforward. By means of the conformal mapping technique, the two-dimensional (2-D) (or lateral) current flow and current crowding, owing to the presence of a gap between the TLM mesa and contacts, are jointly incorporated into our model using a single shunt resistor. QTD-TLM is generalized as it is applicable to a variety of contact dimensions and gap widths, and to both alloyed and nonalloyed contacts. The validity of QTD-TLM has been verified experimentally using two alloyed and two nonalloyed ohmic contacts, and by comparison with results from a 2-D numerical model.|
|Source Title:||IEEE Transactions on Electron Devices|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Mar 21, 2019
WEB OF SCIENCETM
checked on Mar 13, 2019
checked on Mar 2, 2019
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.