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https://doi.org/10.1063/1.1691170
DC Field | Value | |
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dc.title | Quantum mechanical modeling of gate capacitance and gate current in tunnel dielectric stack structures for nonvolatile memory application | |
dc.contributor.author | Koh, B.H. | |
dc.contributor.author | Chim, W.K. | |
dc.contributor.author | Ng, T.H. | |
dc.contributor.author | Zheng, J.X. | |
dc.contributor.author | Choi, W.K. | |
dc.date.accessioned | 2014-10-07T04:35:28Z | |
dc.date.available | 2014-10-07T04:35:28Z | |
dc.date.issued | 2004-05-01 | |
dc.identifier.citation | Koh, B.H., Chim, W.K., Ng, T.H., Zheng, J.X., Choi, W.K. (2004-05-01). Quantum mechanical modeling of gate capacitance and gate current in tunnel dielectric stack structures for nonvolatile memory application. Journal of Applied Physics 95 (9) : 5094-5103. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1691170 | |
dc.identifier.issn | 00218979 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/82952 | |
dc.description.abstract | A self-consistent quantum mechanical (QM) numerical calculations, using an in-house developed charge quantization simulation program, were conducted to analyze the gate tunneling current and capacitance of metal-insulator- semiconductor (MIS) device with tunnel dielectric stack structures. The transmission probability through the dielectric stack structure was calculated by using a gate current density-gate voltage (Jg-Vg) simulation that uses a recursive method. It was shown that a physical model was used to fit with capacitance-voltage and Jg-Vg measurements on MIS devices with different single-layer dielectric and multilayered dielectric stack structures. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.1691170 | |
dc.source | Scopus | |
dc.type | Article | |
dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
dc.description.doi | 10.1063/1.1691170 | |
dc.description.sourcetitle | Journal of Applied Physics | |
dc.description.volume | 95 | |
dc.description.issue | 9 | |
dc.description.page | 5094-5103 | |
dc.description.coden | JAPIA | |
dc.identifier.isiut | 000220875400089 | |
Appears in Collections: | Staff Publications |
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