Please use this identifier to cite or link to this item:
|Title:||Practical superjuction MOSFET device performance under given process thermal cycles|
|Citation:||Zhong, H., Liang, Y.C., Samudra, G.S., Yang, X. (2004-08). Practical superjuction MOSFET device performance under given process thermal cycles. Semiconductor Science and Technology 19 (8) : 987-996. ScholarBank@NUS Repository. https://doi.org/10.1088/0268-1242/19/8/007|
|Abstract:||The performance of specific on-state resistance (Ron.sp) versus breakdown voltage (Vbr) of a superjunction power MOSFET device is constrained by the quality of its sidewail junctions formed by neighbouring p and n columns in the drift region. The p-n junction quality, which is inevitably affected by the inter-column dopant diffusion in practice, will limit the Ron.sp-Vbr device performance if no compensation measure is taken. A detailed study of the influence of sidewall junction quality on performance at various column widths under given thermal process conditions was carried out through process and device simulations. The study discovers the practical optimal performance of superjunction (SJ) DMOS and UMOS structures under the influence of dopant inter-column diffusion. Analysis of the phenomenon shows that the degradation of the breakdown voltage is caused by the p and n column charge imbalance. Practical SJ performance equations, which model the influence reasonably well, are derived in the paper. These equations can be used to predict the practical performance of an SJ device under given thermal conditions, which in turn guides us to the compensation measures required to achieve better performance.|
|Source Title:||Semiconductor Science and Technology|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Sep 19, 2018
WEB OF SCIENCETM
checked on Sep 4, 2018
checked on Sep 14, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.