Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.3647781
Title: Mega-electron-volt proton irradiation on supported and suspended graphene: A Raman spectroscopic layer dependent study
Authors: Mathew, S. 
Chan, T.K. 
Zhan, D.
Gopinadhan, K. 
Roy Barman, A.
Breese, M.B.H. 
Dhar, S. 
Shen, Z.X.
Venkatesan, T. 
Thong, J.T.L. 
Issue Date: 15-Oct-2011
Citation: Mathew, S., Chan, T.K., Zhan, D., Gopinadhan, K., Roy Barman, A., Breese, M.B.H., Dhar, S., Shen, Z.X., Venkatesan, T., Thong, J.T.L. (2011-10-15). Mega-electron-volt proton irradiation on supported and suspended graphene: A Raman spectroscopic layer dependent study. Journal of Applied Physics 110 (8) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3647781
Abstract: Graphene samples with 1, 2, and 4 layers and 1 + 1 folded bi-layers and graphite have been irradiated with 2 MeV protons at fluences ranging from 1 × 1015 to 6 × 1018 ions/cm2. The samples were characterized using visible and UV Raman spectroscopy and Raman microscopy. The ion-induced defects were found to decrease with increasing number of layers. Graphene samples suspended over etched holes in SiO 2 have been fabricated and used to investigate the influence of the substrate SiO2 for defect creation in graphene. While Raman vibrational modes at 1460 cm-1 and 1555 cm-1 have been observed in the visible Raman spectra of substantially damaged graphene samples, these modes were absent in the irradiated-suspended monolayer graphene. © 2011 American Institute of Physics.
Source Title: Journal of Applied Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/82677
ISSN: 00218979
DOI: 10.1063/1.3647781
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

31
checked on Aug 17, 2018

WEB OF SCIENCETM
Citations

28
checked on Aug 8, 2018

Page view(s)

53
checked on Jul 27, 2018

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.