Please use this identifier to cite or link to this item:
https://doi.org/10.1002/adma.200700086
DC Field | Value | |
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dc.title | Injection-induced de-doping in a conducting polymer during device operation: Asymmetry in the hole injection and extraction rates | |
dc.contributor.author | Chia, P.-J. | |
dc.contributor.author | Chua, L.-L. | |
dc.contributor.author | Sivaramakrishnan, S. | |
dc.contributor.author | Zhuo, J.-M. | |
dc.contributor.author | Zhao, L.-H. | |
dc.contributor.author | Sim, W.-S. | |
dc.contributor.author | Yeo, Y.-C. | |
dc.contributor.author | Ho, P.K.-H. | |
dc.date.accessioned | 2014-10-07T04:30:37Z | |
dc.date.available | 2014-10-07T04:30:37Z | |
dc.date.issued | 2007-12-03 | |
dc.identifier.citation | Chia, P.-J., Chua, L.-L., Sivaramakrishnan, S., Zhuo, J.-M., Zhao, L.-H., Sim, W.-S., Yeo, Y.-C., Ho, P.K.-H. (2007-12-03). Injection-induced de-doping in a conducting polymer during device operation: Asymmetry in the hole injection and extraction rates. Advanced Materials 19 (23) : 4202-4207. ScholarBank@NUS Repository. https://doi.org/10.1002/adma.200700086 | |
dc.identifier.issn | 09359648 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/82543 | |
dc.description.abstract | Injection-induced De-doping in a conducting polymer, poly(3,4- ethylenedioxythiophene) (PEDT) poly(styrenesulfonic acid)(PSSH) during device operation was reported. PEDT:PSSH is strongly acidic on account of the excess PSSH, and often contaminated with ions leftover from the oxidation reaction. The hole extraction PEDT+ → PEDT0 + h+ at the negative contact occurs more readily than hole injection from the opposite contact, which builds up a transient population of PEDT+ of a lower oxidation state across the electrode gap. Electrochemistry occurs in PEDT:PSS to give gas evolution and film spalling. The value across a lateral Au electrode gap was mapped using the Raman spectroscopy to determine whether the doping level of PEDT is permanently altered. The de-doping was confirmed by Fourier Transform Infrared Spectroscopy, which shows loss of the doping-induced infrared modes. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1002/adma.200700086 | |
dc.source | Scopus | |
dc.type | Article | |
dc.contributor.department | PHYSICS | |
dc.contributor.department | CHEMISTRY | |
dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
dc.description.doi | 10.1002/adma.200700086 | |
dc.description.sourcetitle | Advanced Materials | |
dc.description.volume | 19 | |
dc.description.issue | 23 | |
dc.description.page | 4202-4207 | |
dc.description.coden | ADVME | |
dc.identifier.isiut | 000251910100015 | |
Appears in Collections: | Staff Publications |
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