Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.tsf.2006.07.130
Title: Influence of GaNAs strain compensation layers upon annealing of GaIn(N)As/GaAs quantum wells
Authors: Liu, H.F. 
Xiang, N. 
Keywords: Annealing
Dilute nitrides
Photoluminescence
Issue Date: 26-Mar-2007
Citation: Liu, H.F., Xiang, N. (2007-03-26). Influence of GaNAs strain compensation layers upon annealing of GaIn(N)As/GaAs quantum wells. Thin Solid Films 515 (10) : 4462-4466. ScholarBank@NUS Repository. https://doi.org/10.1016/j.tsf.2006.07.130
Abstract: GaIn(N)As/GaAs and GaIn(N)As/GaNAs/GaAs quantum well samples, with and without GaNAs strain-compensating layers (SCL), were grown on GaAs (001) substrates by molecular beam epitaxy. Photoluminescence (PL) was used to study the effects of the GaNAs SCL on the properties of the Ga(In)NAs QWs upon annealing. It is found that an extra blue-shift (ΔE = 5.2 meV) in the PL emission from the GaInNAs QW sample at the initial annealing stage (tann = 40 s) was induced by the GaNAs SCLs. However, for the GaInAs QW sample, the blue-shift induced by GaNAs SCL is only 1.1 meV. As the annealing time was increased, the blue-shift of both GaInNAs and GaInAs QWs showed saturations at 16 meV and 8 meV, respectively. The PL blue-shifts were much enhanced by inserting GaNAs SCLs showing a non-saturable behavior. X-ray diffractions from the strain compensated GaIn(N)As QWs before and after annealing show no N atom diffusion but Ga/In atom interdiffusion across the QW interfaces. The Ga/In atom interdiffusion caused by annealing was also confirmed by high-resolution transmission electron microscopy from the GaInNAs/GaAs QW sample. © 2006 Elsevier B.V. All rights reserved.
Source Title: Thin Solid Films
URI: http://scholarbank.nus.edu.sg/handle/10635/82531
ISSN: 00406090
DOI: 10.1016/j.tsf.2006.07.130
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

Page view(s)

34
checked on Aug 3, 2018

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.