Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.jcrysgro.2004.11.347
DC FieldValue
dc.titleImprovement of self-organized InAs quantum dots growth by molecular beam epitaxy
dc.contributor.authorMiao, Z.L.
dc.contributor.authorChua, S.J.
dc.contributor.authorChye, Y.H.
dc.contributor.authorChen, P.
dc.contributor.authorTripathy, S.
dc.date.accessioned2014-10-07T04:30:13Z
dc.date.available2014-10-07T04:30:13Z
dc.date.issued2005-03-15
dc.identifier.citationMiao, Z.L., Chua, S.J., Chye, Y.H., Chen, P., Tripathy, S. (2005-03-15). Improvement of self-organized InAs quantum dots growth by molecular beam epitaxy. Journal of Crystal Growth 276 (1-2) : 72-76. ScholarBank@NUS Repository. https://doi.org/10.1016/j.jcrysgro.2004.11.347
dc.identifier.issn00220248
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/82509
dc.description.abstractUniform InAs quantum dots (QDs) with high density up to 1.16×10 11 cm -2 were grown by molecular beam epitaxy by precisely controlling the growth rate of InAs QDs and using periodical micro-disturbance (PMD) technique. A method to precisely measure InAs QDs growth rate is developed with the assistance of in situ reflective high-energy electron diffraction. The PMD technique is proposed to function as a "filter" to prevent big QDs formation, while maintaining the uniformity and high density of the QDs. Enhanced intensity and narrow linewidth of the photoluminescence from the InAs QDs grown on the PMD layer are attributed to the high density and uniformity of the QDs. © 2004 Elsevier B.V. All rights reserved.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/j.jcrysgro.2004.11.347
dc.sourceScopus
dc.subjectA1. Nanostructures
dc.subjectA1. Surface structure
dc.subjectA3. Molecular beamepitaxy
dc.subjectB2. Semiconducting III-V materials
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1016/j.jcrysgro.2004.11.347
dc.description.sourcetitleJournal of Crystal Growth
dc.description.volume276
dc.description.issue1-2
dc.description.page72-76
dc.description.codenJCRGA
dc.identifier.isiut000228218300011
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