Please use this identifier to cite or link to this item:
|Title:||First-principles study on the concentrations of native point defects in high-dielectric-constant binary oxide materials|
|Source:||Zheng, J.X., Ceder, G., Chim, W.K. (2008-10). First-principles study on the concentrations of native point defects in high-dielectric-constant binary oxide materials. Physica Status Solidi - Rapid Research Letters 2 (5) : 227-229. ScholarBank@NUS Repository. https://doi.org/10.1002/pssr.200802152|
|Abstract:||The intrinsic concentrations of point defects in high-k binary oxide materials of HfO2, ZrO2, Y2O3 and La2O3 are evaluated on the basis of first-principles calculations. Oxygen defects are found to dominate over a wide range of the oxygen chemical potential. Neutral oxygen vacancies are likely to be responsible for electron trapping in the investigated materials. In HfO2 and ZrO2, oxygen Frenkel pairs are likely to form. © 2008 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.|
|Source Title:||Physica Status Solidi - Rapid Research Letters|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Feb 27, 2018
WEB OF SCIENCETM
checked on Feb 14, 2018
checked on Mar 12, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.