1. ScholarBank@NUS
  2. 1. Staff
  3. Staff Publications
Please use this identifier to cite or link to this item: https://doi.org/10.1109/LED.2005.857684
DC FieldValue
dc.titleFast DNBTI components in p-MOSFET with SiON dielectric
dc.contributor.authorYang, T.
dc.contributor.authorShen, C.
dc.contributor.authorLi, M.F.
dc.contributor.authorAng, C.H.
dc.contributor.authorZhu, C.X.
dc.contributor.authorYeo, Y.-C.
dc.contributor.authorSamudra, G.
dc.contributor.authorRustagi, S.C.
dc.contributor.authorYu, M.B.
dc.contributor.authorKwong, D.-L.
dc.date.accessioned2014-10-07T04:28:17Z
dc.date.available2014-10-07T04:28:17Z
dc.date.issued2005-11
dc.identifier.citationYang, T., Shen, C., Li, M.F., Ang, C.H., Zhu, C.X., Yeo, Y.-C., Samudra, G., Rustagi, S.C., Yu, M.B., Kwong, D.-L. (2005-11). Fast DNBTI components in p-MOSFET with SiON dielectric. IEEE Electron Device Letters 26 (11) : 826-828. ScholarBank@NUS Repository. https://doi.org/10.1109/LED.2005.857684
dc.identifier.issn07413106
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/82346
dc.description.abstractFor the first time, we perform a systematic investigation of the fast components of dynamic negative biased temperature instability (DNBTI) in p-MOSFET with an ultrathin SiON gate dielectric. Experimental results unambiguously show a fast DNBTI component measured by a recently developed fast measurement method, and this component is due to trapping and detrapping of hole traps Not in SiON. The cumulative degradation increases with increasing stress frequency. Model simulations are in excellent agreement with all experimental data. © 2005 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/LED.2005.857684
dc.sourceScopus
dc.subjectDynamic negative biased temperature instability (DNBTI)
dc.subjectMOSFETs
dc.subjectSiON
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1109/LED.2005.857684
dc.description.sourcetitleIEEE Electron Device Letters
dc.description.volume26
dc.description.issue11
dc.description.page826-828
dc.description.codenEDLED
dc.identifier.isiut000232821500016
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.