Please use this identifier to cite or link to this item: https://doi.org/10.1007/s10948-010-0890-x
Title: Effect of frozen magnetic flux on the electrical transport characteristics of superconductor-ferromagnet junction
Authors: Bakaul, S.R.
Wu, B.L.
Han, G.C.
Wu, Y.H. 
Keywords: Andreev reflection
Critical current
Frozen flux
Superconductor-ferromagnet junction
Issue Date: Jan-2011
Citation: Bakaul, S.R., Wu, B.L., Han, G.C., Wu, Y.H. (2011-01). Effect of frozen magnetic flux on the electrical transport characteristics of superconductor-ferromagnet junction. Journal of Superconductivity and Novel Magnetism 24 (1-2) : 951-955. ScholarBank@NUS Repository. https://doi.org/10.1007/s10948-010-0890-x
Abstract: We studied electrical transport characteristics of lateral superconductor (SC)-ferromagnet (FM)-superconductor devices which were found to exhibit two strikingly different differential resistance states at zero field. The key difference between these states is that the critical current (I c) is dramatically lower for one state (state 2) than the other (state 1). Moreover, state 2 exhibits a higher zero bias resistance than state 1. We explain this as an effect of magnetic field from the frozen flux in SC on the Andreev reflection process at the SC-FM interface. The magnetoresistance (MR) curves at different dc current biases are nonhysteretic and symmetric with respect to zero field axis when the device is at state 1. In contrary to this, MR curves at state 2 are asymmetric and show a pronounced hysteresis at high bias current. These effects indicate a coupling between applied field and frozen flux, which affects the transport characteristics of the SC-FM interface. © Springer Science+Business Media, LLC 2010.
Source Title: Journal of Superconductivity and Novel Magnetism
URI: http://scholarbank.nus.edu.sg/handle/10635/82197
ISSN: 15571939
DOI: 10.1007/s10948-010-0890-x
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.