Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.3383042
Title: Dependence of the properties of phase change random access memory on nitrogen doping concentration in Ge2Sb2 Te5
Authors: Fang, L.W.-W.
Zhao, R.
Li, M.
Lim, K.-G.
Shi, L.
Chong, T.-C. 
Yeo, Y.-C. 
Issue Date: 15-May-2010
Citation: Fang, L.W.-W., Zhao, R., Li, M., Lim, K.-G., Shi, L., Chong, T.-C., Yeo, Y.-C. (2010-05-15). Dependence of the properties of phase change random access memory on nitrogen doping concentration in Ge2Sb2 Te5. Journal of Applied Physics 107 (10) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3383042
Abstract: The dependence of the electrical properties of Ge2Sb2 Te5 on nitrogen doping concentration was investigated, which was explained based on the trends in the materials properties of nitrogen-doped Ge2 Sb2 Te5. The effect of nitrogen doping in Ge2Sb2 Te5 on the crystallization temperature and changes upon annealing with various nitrogen concentrations were thus exploited to explain the trends. X-ray diffraction analysis corroborates the necessity to transform to the metastable face-centered-cubic phase, and showed that direct conversion to the stable hexagonal-close-packed phase which occurs at higher nitrogen concentrations could adversely affect device performance. Approaches for enhancement of thermal stability and reduction in reset current in phase change memory devices were also discussed. © 2010 American Institute of Physics.
Source Title: Journal of Applied Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/82122
ISSN: 00218979
DOI: 10.1063/1.3383042
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

19
checked on Dec 12, 2018

WEB OF SCIENCETM
Citations

21
checked on Dec 12, 2018

Page view(s)

31
checked on Dec 8, 2018

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.