Please use this identifier to cite or link to this item: https://doi.org/10.1002/pssr.201105537
Title: Characterization of high-density bit-patterned media using ultra-high resolution magnetic force microscopy
Authors: Piramanayagam, S.N.
Ranjbar, M.
Sbiaa, R.
Tavakkoli K.G.A.
Chong, T.C. 
Keywords: Bit-patterned media
Magnetic force microscopy
Nanostructures
Perpendicular magnetic anisotropy
Issue Date: Mar-2012
Source: Piramanayagam, S.N., Ranjbar, M., Sbiaa, R., Tavakkoli K.G.A., Chong, T.C. (2012-03). Characterization of high-density bit-patterned media using ultra-high resolution magnetic force microscopy. Physica Status Solidi - Rapid Research Letters 6 (3) : 141-143. ScholarBank@NUS Repository. https://doi.org/10.1002/pssr.201105537
Abstract: Bit-patterned media at one terabit-per-square-inch (Tb/in 2) recording density require a feature size of about 12 nm. The fabrication and characterization of such magnetic nanostructures is still a challenge. In this Letter, we show that magnetic dots can be resolved at 10 nm spacing using magnetic force microscopy (MFM) tips coated with a magnetic film possessing a perpendicular magnetic anisotropy (PMA). Compared to MFM tips with no special magnetic anisotropy, MFM tips with PMA can resolve the bits clearly, because of a smaller magnetic interaction volume, enabling a simple technique for characterizing fine magnetic nanostructures. © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Source Title: Physica Status Solidi - Rapid Research Letters
URI: http://scholarbank.nus.edu.sg/handle/10635/82041
ISSN: 18626254
DOI: 10.1002/pssr.201105537
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