Please use this identifier to cite or link to this item: https://doi.org/10.1117/12.327919
DC FieldValue
dc.titleThermal modeling of phase change optical recording disk
dc.contributor.authorShi, L.P.
dc.contributor.authorChong, T.C.
dc.contributor.authorHo, J.J.
dc.contributor.authorLiu, Z.J.
dc.contributor.authorXu, B.X.
dc.contributor.authorMiao, X.S.
dc.contributor.authorHuang, Y.M.
dc.contributor.authorTan, P.K.
dc.contributor.authorLim, K.G.
dc.date.accessioned2014-10-07T03:11:58Z
dc.date.available2014-10-07T03:11:58Z
dc.date.issued1998
dc.identifier.citationShi, L.P., Chong, T.C., Ho, J.J., Liu, Z.J., Xu, B.X., Miao, X.S., Huang, Y.M., Tan, P.K., Lim, K.G. (1998). Thermal modeling of phase change optical recording disk. Proceedings of SPIE - The International Society for Optical Engineering 3401 : 71-78. ScholarBank@NUS Repository. https://doi.org/10.1117/12.327919
dc.identifier.issn0277786X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/81780
dc.description.abstractA new thermal model to study the laser induced temperature profile of a multilayered phase change optical recording disk is proposed. The new model considers the thermal effect generated by both the transmission and reflection light. The calculation formulae are listed. The model is used to simulate the Ge2Sb2Te5 phase change optical disks with five layers structure. In order to study the differences between the new and existing models, simulations are carried out using both models and the differences are compared. The differences get larger as the phase change layer becomes thinner. It is also revealed that the differences get larger as the wavelength becomes shorter. The idea proposed in this paper is also suitable for the analysis of magneto-optical disks as well as for improved accuracy in the measurement of thermal parameters.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1117/12.327919
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentDATA STORAGE INSTITUTE
dc.contributor.departmentELECTRICAL ENGINEERING
dc.description.doi10.1117/12.327919
dc.description.sourcetitleProceedings of SPIE - The International Society for Optical Engineering
dc.description.volume3401
dc.description.page71-78
dc.description.codenPSISD
dc.identifier.isiut000076922000010
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