Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/81642
Title: Optical and x-ray diffraction characterization of MBE-grown InGaAs, InAIAs and InGaAIAs on InP
Authors: Feng, Z.C. 
Chua, S.J. 
Raman, A.
Lim, N.N. 
Issue Date: 1994
Source: Feng, Z.C.,Chua, S.J.,Raman, A.,Lim, N.N. (1994). Optical and x-ray diffraction characterization of MBE-grown InGaAs, InAIAs and InGaAIAs on InP. Materials Research Society Symposium - Proceedings 340 : 53-58. ScholarBank@NUS Repository.
Abstract: A variety of In1-xGaxAs, In1-yAlyAs and In1-x-yGaxAlyAs films have been grown on InP by molecular beam epitaxy. A comprehensive characterization was performed using Raman scattering, photoluminescence (PL), Fourier transform infrared (FTIR) spectroscopy and double crystal X-ray diffraction on these ternary and quaternary heterostructures with different compositions and growth conditions. The lattice matched and mismatched structures a growth conditions. The lattice matched and mismatched structures are studied. Our analyses show that the interface mismatch exerts an important influence on the optical properties of these heterostructures, and conversely that Raman, PL and FTIR can be used to probe the interface mismatch nondestructively.
Source Title: Materials Research Society Symposium - Proceedings
URI: http://scholarbank.nus.edu.sg/handle/10635/81642
ISSN: 02729172
Appears in Collections:Staff Publications

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