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|Title:||Improved technique for measuring complex scattering coefficients of two-port microwave devices using only six power detectors|
|Authors:||Yeo, S.P. |
|Citation:||Yeo, S.P.,Ang, C.K.,Cheng, M. (1998). Improved technique for measuring complex scattering coefficients of two-port microwave devices using only six power detectors. Conference Record - IEEE Instrumentation and Measurement Technology Conference 1 : 638-641. ScholarBank@NUS Repository.|
|Abstract:||The paper describes an improved technique for measuring the complex scattering coefficients of microwave two-port devices using the novel nine-port network analyzer. Tests on earlier prototypes of this instrument (comprising two symmetrical five-port junctions, six power detectors, two directional couplers and a phase shifter) have demonstrated that a re-arrangement of the inter-connections among the constituent components is able to yield an enhancement of performance (due to changes in the interaction of the waves within the system).|
|Source Title:||Conference Record - IEEE Instrumentation and Measurement Technology Conference|
|Appears in Collections:||Staff Publications|
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