Please use this identifier to cite or link to this item:
|Title:||Improved technique for measuring complex scattering coefficients of two-port microwave devices using only six power detectors|
|Authors:||Yeo, S.P. |
|Source:||Yeo, S.P.,Ang, C.K.,Cheng, M. (1998). Improved technique for measuring complex scattering coefficients of two-port microwave devices using only six power detectors. Conference Record - IEEE Instrumentation and Measurement Technology Conference 1 : 638-641. ScholarBank@NUS Repository.|
|Abstract:||The paper describes an improved technique for measuring the complex scattering coefficients of microwave two-port devices using the novel nine-port network analyzer. Tests on earlier prototypes of this instrument (comprising two symmetrical five-port junctions, six power detectors, two directional couplers and a phase shifter) have demonstrated that a re-arrangement of the inter-connections among the constituent components is able to yield an enhancement of performance (due to changes in the interaction of the waves within the system).|
|Source Title:||Conference Record - IEEE Instrumentation and Measurement Technology Conference|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Mar 9, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.