Please use this identifier to cite or link to this item:
https://doi.org/10.1103/PhysRevB.50.7996
DC Field | Value | |
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dc.title | Two-electron state and negative-U property of sulfur DX centers in GaAs1-xPx | |
dc.contributor.author | Li, M.F. | |
dc.contributor.author | Luo, Y.Y. | |
dc.contributor.author | Yu, P.Y. | |
dc.contributor.author | Weber, E.R. | |
dc.contributor.author | Fujioka, H. | |
dc.contributor.author | Du, A.Y. | |
dc.contributor.author | Chua, S.J. | |
dc.contributor.author | Lim, Y.T. | |
dc.date.accessioned | 2014-10-07T03:07:02Z | |
dc.date.available | 2014-10-07T03:07:02Z | |
dc.date.issued | 1994 | |
dc.identifier.citation | Li, M.F., Luo, Y.Y., Yu, P.Y., Weber, E.R., Fujioka, H., Du, A.Y., Chua, S.J., Lim, Y.T. (1994). Two-electron state and negative-U property of sulfur DX centers in GaAs1-xPx. Physical Review B 50 (11) : 7996-7999. ScholarBank@NUS Repository. https://doi.org/10.1103/PhysRevB.50.7996 | |
dc.identifier.issn | 01631829 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/81320 | |
dc.description.abstract | A new way to study the two-electron state in DX centers at atmospheric pressure is reported. It is based on the idea of codoping a GaAs0.6P0.4 sample with a uniform background of Te shallow donors (as source of free carriers) and a Gaussian distribution of sulfur DX centers by ion implantation. Using both capacitance-voltage profiling and deep-level transient spectroscopy measurements, we demonstrate that the ground state of the sulfur DX center traps two electrons and therefore has negative U. © 1994 The American Physical Society. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1103/PhysRevB.50.7996 | |
dc.source | Scopus | |
dc.type | Article | |
dc.contributor.department | ELECTRICAL ENGINEERING | |
dc.description.doi | 10.1103/PhysRevB.50.7996 | |
dc.description.sourcetitle | Physical Review B | |
dc.description.volume | 50 | |
dc.description.issue | 11 | |
dc.description.page | 7996-7999 | |
dc.identifier.isiut | A1994PJ43700097 | |
Appears in Collections: | Staff Publications |
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