The effects of current spreading in the semiconductor on the determination of contact resistance

Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/81249

DC Field	Value
dc.title	The effects of current spreading in the semiconductor on the determination of contact resistance
dc.contributor.author	Chua, S.J.
dc.contributor.author	Chong, T.C.
dc.contributor.author	Lee, S.H.
dc.contributor.author	Wang, Y.S.
dc.date.accessioned	2014-10-07T03:06:17Z
dc.date.available	2014-10-07T03:06:17Z
dc.date.issued	1990-08
dc.identifier.citation	Chua, S.J.,Chong, T.C.,Lee, S.H.,Wang, Y.S. (1990-08). The effects of current spreading in the semiconductor on the determination of contact resistance. Solid State Electronics 33 (8) : 1110-1112. ScholarBank@NUS Repository.
dc.identifier.issn	00381101
dc.identifier.uri	http://scholarbank.nus.edu.sg/handle/10635/81249
dc.source	Scopus
dc.type	Article
dc.contributor.department	ELECTRICAL ENGINEERING
dc.description.sourcetitle	Solid State Electronics
dc.description.volume	33
dc.description.issue	8
dc.description.page	1110-1112
dc.description.coden	SSELA
dc.identifier.isiut	NOT_IN_WOS
Appears in Collections:	Staff Publications

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