Please use this identifier to cite or link to this item:
https://scholarbank.nus.edu.sg/handle/10635/80573
DC Field | Value | |
---|---|---|
dc.title | Improved four-port instrument using two power detectors to measure complex reflection coefficients of microwave devices | |
dc.contributor.author | Yeo, S.P. | |
dc.contributor.author | Cheng, M. | |
dc.date.accessioned | 2014-10-07T02:59:00Z | |
dc.date.available | 2014-10-07T02:59:00Z | |
dc.date.issued | 1996-03-14 | |
dc.identifier.citation | Yeo, S.P.,Cheng, M. (1996-03-14). Improved four-port instrument using two power detectors to measure complex reflection coefficients of microwave devices. Electronics Letters 32 (6) : 565-566. ScholarBank@NUS Repository. | |
dc.identifier.issn | 00135194 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/80573 | |
dc.description.abstract | An improved prototype of the multi-state four port reflectometer (which uses only two power detectors) is used for measuring the complex reflection coefficients of microwave devices. Laboratory tests indicate that the measurement uncertainties for the proposed instrument are within ±0.01 for magnitude and ±1.5° for phase. | |
dc.source | Scopus | |
dc.subject | Microwave measurement | |
dc.subject | Reflectometers | |
dc.type | Article | |
dc.contributor.department | MECHANICAL & PRODUCTION ENGINEERING | |
dc.contributor.department | ELECTRICAL ENGINEERING | |
dc.description.sourcetitle | Electronics Letters | |
dc.description.volume | 32 | |
dc.description.issue | 6 | |
dc.description.page | 565-566 | |
dc.description.coden | ELLEA | |
dc.identifier.isiut | NOT_IN_WOS | |
Appears in Collections: | Staff Publications |
Show simple item record
Files in This Item:
There are no files associated with this item.
Google ScholarTM
Check
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.