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|Title:||Improved four-port instrument using two power detectors to measure complex reflection coefficients of microwave devices|
|Authors:||Yeo, S.P. |
|Citation:||Yeo, S.P.,Cheng, M. (1996-03-14). Improved four-port instrument using two power detectors to measure complex reflection coefficients of microwave devices. Electronics Letters 32 (6) : 565-566. ScholarBank@NUS Repository.|
|Abstract:||An improved prototype of the multi-state four port reflectometer (which uses only two power detectors) is used for measuring the complex reflection coefficients of microwave devices. Laboratory tests indicate that the measurement uncertainties for the proposed instrument are within ±0.01 for magnitude and ±1.5° for phase.|
|Source Title:||Electronics Letters|
|Appears in Collections:||Staff Publications|
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