Please use this identifier to cite or link to this item:
|Title:||Characterization of MBE-grown Ga1-xAlxAs alloy films by Raman scattering|
|Authors:||Hou, Y.T. |
|Source:||Hou, Y.T.,Feng, Z.C.,Li, M.F.,Chua, S.J. (1999). Characterization of MBE-grown Ga1-xAlxAs alloy films by Raman scattering. Surface and Interface Analysis 28 (1) : 163-165. ScholarBank@NUS Repository. https://doi.org/10.1002/(SICI)1096-9918(199908)28:13.0.CO;2-I|
|Abstract:||Molecular beam epitaxy (MBE)-grown ternary Ga1-xAlxAs films, with Al composition x ranging from 0 to 1 in steps of 0.1, have been studied by Raman scattering at room temperature and at 80 K. The observed broadening and asymmetry of the first-order longitudinal-optical phonon spectra induced by alloy disorder are simulated using the spatial correlation model. The obtained correlation length for GaAs-like and AlAs-like modes are observed to decrease as the reduction of Ga composition 1-x and Al composition x, respectively. It is also shown that the correlation length depends sensitively on the composition. No significant temperature or phonon mode dependence is found. A combination with thermodynamic analysis suggests that the random compositional distribution in alloy seems to be the dominant contribution to this disorder effect.|
|Source Title:||Surface and Interface Analysis|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Jan 13, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.