Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/78589
Title: NANOSCALE IMAGING OF PLASMONIC STRUCTURES WITH A TRANSMISSION PHOTOEMISSION ELECTRON MICROSCOPE
Authors: AI ZHONGKAI
Keywords: Photoemission, Transmission PEEM, Plasmonics, Helium ion microscope, Stochastic space charge effect, FDTD simulation
Issue Date: 20-Aug-2013
Source: AI ZHONGKAI (2013-08-20). NANOSCALE IMAGING OF PLASMONIC STRUCTURES WITH A TRANSMISSION PHOTOEMISSION ELECTRON MICROSCOPE. ScholarBank@NUS Repository.
Abstract: This work demonstrates a non-perturbative technique to directly image nanoscale metallic structures and their optical characteristics by exploiting their photoemission of electrons. It presents the design, fabrication, system integration and ultimate demonstration of plasmonic imaging capabilities. Experimental validation of system?s imaging performance better than 20 nm has been achieved. Several plasmonic structures were investigated to reveal its potential. The structures presented in this work were patterned with a helium ion microscope (HIM) on free standing aluminum films (80nm thick) with critical dimensions as small as 40 nm. Experimental characterization was compared with rigorous Finite Difference Time Domain simulations (FDTD) of the resonant field distributions as well the behavior of the excited surface plasmon waves, with very good agreement observed. The successful design, fabrication and characterization of our instrument and experimental validation of novel contrast mechanisms have opened various devices to investigation at unprecedented spatial and temporal resolutions.
URI: http://scholarbank.nus.edu.sg/handle/10635/78589
Appears in Collections:Ph.D Theses (Open)

Show full item record
Files in This Item:
File Description SizeFormatAccess SettingsVersion 
AI Zhongkai PhD.pdf7.89 MBAdobe PDF

OPEN

NoneView/Download

Page view(s)

110
checked on Feb 17, 2018

Download(s)

36
checked on Feb 17, 2018

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.