Please use this identifier to cite or link to this item:
|Title:||SAW: System-assisted wear leveling on the write endurance of NAND flash devices|
|Source:||Wang, C.,Wong, W.-F. (2013). SAW: System-assisted wear leveling on the write endurance of NAND flash devices. Proceedings - Design Automation Conference : -. ScholarBank@NUS Repository. https://doi.org/10.1145/2463209.2488937|
|Abstract:||The write endurance of NAND flash memory adversely impacts the lifetime of flash devices. A flash cell is likely to wear out after undergoing excessive program/erase (P/E) flips. Wear leveling is hence employed to spread erase operations as evenly as possible. It is traditionally conducted by the flash translation layer (FTL), a management firmware residing in flash devices. In this paper, we shall propose a novel wear leveling algorithm involving the operating system (OS). We will show that our operating System-Assisted Wear leveling (SAW) algorithm can significantly improve the wear evenness. SAW takes advantage of OS's knowledge about files at a higher level of abstraction, and provides useful hints to the lower-level FTL to accommodate data. A prototype based on a file system and an FTL has been developed to verify the effectiveness of SAW. Experiments show that wear evenness can be improved by as much as 85.0% compared to the state-of-the-art FTL wear leveling schemes. Copyright © 2013 ACM.|
|Source Title:||Proceedings - Design Automation Conference|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Mar 8, 2018
checked on Mar 10, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.