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Title: SAW: System-assisted wear leveling on the write endurance of NAND flash devices
Authors: Wang, C.
Wong, W.-F. 
Issue Date: 2013
Citation: Wang, C.,Wong, W.-F. (2013). SAW: System-assisted wear leveling on the write endurance of NAND flash devices. Proceedings - Design Automation Conference : -. ScholarBank@NUS Repository.
Abstract: The write endurance of NAND flash memory adversely impacts the lifetime of flash devices. A flash cell is likely to wear out after undergoing excessive program/erase (P/E) flips. Wear leveling is hence employed to spread erase operations as evenly as possible. It is traditionally conducted by the flash translation layer (FTL), a management firmware residing in flash devices. In this paper, we shall propose a novel wear leveling algorithm involving the operating system (OS). We will show that our operating System-Assisted Wear leveling (SAW) algorithm can significantly improve the wear evenness. SAW takes advantage of OS's knowledge about files at a higher level of abstraction, and provides useful hints to the lower-level FTL to accommodate data. A prototype based on a file system and an FTL has been developed to verify the effectiveness of SAW. Experiments show that wear evenness can be improved by as much as 85.0% compared to the state-of-the-art FTL wear leveling schemes. Copyright © 2013 ACM.
Source Title: Proceedings - Design Automation Conference
ISBN: 9781450320719
ISSN: 0738100X
DOI: 10.1145/2463209.2488937
Appears in Collections:Staff Publications

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