Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/77833
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dc.titleConditional random field with high-order dependencies for sequence labeling and segmentation
dc.contributor.authorCuong, N.V.
dc.contributor.authorYe, N.
dc.contributor.authorLee, W.S.
dc.contributor.authorChieu, H.L.
dc.date.accessioned2014-07-04T03:09:17Z
dc.date.available2014-07-04T03:09:17Z
dc.date.issued2014
dc.identifier.citationCuong, N.V.,Ye, N.,Lee, W.S.,Chieu, H.L. (2014). Conditional random field with high-order dependencies for sequence labeling and segmentation. Journal of Machine Learning Research 15 : 981-1009. ScholarBank@NUS Repository.
dc.identifier.issn15337928
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/77833
dc.description.abstractDependencies among neighboring labels in a sequence are important sources of information for sequence labeling and segmentation. However, only first-order dependencies, which are dependencies between adjacent labels or segments, are commonly exploited in practice because of the high computational complexity of typical inference algorithms when longer distance dependencies are taken into account. In this paper, we give efficient inference algorithms to handle high-order dependencies between labels or segments in conditional random fields, under the assumption that the number of distinct label patterns used in the features is small. This leads to efficient learning algorithms for these conditional random fields. We show experimentally that exploiting high-order dependencies can lead to substantial performance improvements for some problems, and we discuss conditions under which high-order features can be effective. © 2014 Nguyen Viet Cuong, Nan Ye, Wee Sun Lee and Hai Leong Chieu.
dc.sourceScopus
dc.subjectConditional random field
dc.subjectHigh-order feature
dc.subjectLabel sparsity
dc.subjectSegmentation
dc.subjectSemi-Markov conditional random field
dc.subjectSequence labeling
dc.typeArticle
dc.contributor.departmentCOMPUTER SCIENCE
dc.description.sourcetitleJournal of Machine Learning Research
dc.description.volume15
dc.description.page981-1009
dc.identifier.isiutNOT_IN_WOS
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