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|Title:||Nano-imaging of single cells using STIM|
|Authors:||Minqin, R. |
van Kan, J.A.
Scanning transmission ion microscopy
Single cell imaging
|Citation:||Minqin, R., van Kan, J.A., Bettiol, A.A., Daina, L., Gek, C.Y., Huat, B.B., Whitlow, H.J., Osipowicz, T., Watt, F. (2007-07). Nano-imaging of single cells using STIM. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 260 (1) : 124-129. ScholarBank@NUS Repository. https://doi.org/10.1016/j.nimb.2007.02.015|
|Abstract:||Scanning transmission ion microscopy (STIM) is a technique which utilizes the energy loss of high energy (MeV) ions passing through a sample to provide structural images. In this paper, we have successfully demonstrated STIM imaging of single cells at the nano-level using the high resolution capability of the proton beam writing facility at the Centre for Ion Beam Applications, National University of Singapore. MCF-7 breast cancer cells (American Type Culture Collection [ATCC]) were seeded on to silicon nitride windows, backed by a Hamamatsu pin diode acting as a particle detector. A reasonable contrast was obtained using 1 MeV protons and excellent contrast obtained using 1 MeV alpha particles. In a further experiment, nano-STIM was also demonstrated using cells seeded on to the pin diode directly, and high quality nano-STIM images showing the nucleus and multiple nucleoli were extracted before the detector was significantly damaged. © 2007 Elsevier B.V. All rights reserved.|
|Source Title:||Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms|
|Appears in Collections:||Staff Publications|
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