Please use this identifier to cite or link to this item:
|Title:||Performance of charge-coupled devices in digital shearography|
|Authors:||Ng, Tuck-Wah |
Chau, Fook S.
|Source:||Ng, Tuck-Wah,Chau, Fook S. (1993). Performance of charge-coupled devices in digital shearography. Proceedings of SPIE - The International Society for Optical Engineering 2066 : 14-19. ScholarBank@NUS Repository.|
|Abstract:||The use of charge-coupled devices (CCDs) for imaging in digital shearography necessitates the knowledge of their electronic (signal-independent) noise level, as the visibility of fringes produced is dependent on this factor. A method based on measuring the experimental CCD noise variance to construct a linear equation system is presented. From the solution of this equation system, the electronic noise level of a particular CCD used for imaging can be determined. Evaluation of CCDs based on this noise factor allows the performance of each CCD used in digital shearography to be compared.|
|Source Title:||Proceedings of SPIE - The International Society for Optical Engineering|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Feb 23, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.