Please use this identifier to cite or link to this item:
|Title:||Wafer level packaging of pressure sensor using SU8 photoresist|
Wafer level packaging
|Citation:||Iliescu, C., Tay, F.E.H., Miao, J., Avram, M. (2005). Wafer level packaging of pressure sensor using SU8 photoresist. Proceedings of SPIE - The International Society for Optical Engineering 5649 (PART 1) : 297-305. ScholarBank@NUS Repository. https://doi.org/10.1117/12.582235|
|Abstract:||This paper presents a wafer level packaging solution for MEMS devices using wafer to wafer bonding with SU8-5 negative photoresist. A sensitive piezoelectric pressure sensor with the pressure range between 0 and 0.4 bar was chosen to test the quality of the solution. As stress induced by the packaging technique is the main challenge in MEMS encapsulation, the piezoresistive pressure sensors with its tensometric bridge offer a good opportunity for testing the packaging solution. The offset modification of the diffused piezoresistive Wheatstone bridge fabricated on a 15 μm thin diaphragm is directly influenced by the value of the stress induced by the packaging. In our paper the silicon wafer with pressure sensors is sandwiched between a bottom silicon wafer with etched holes for the applied pressure and a top glass wafer with via-holes and metallization leads. Silicon and Pyrex glass (Corning 7740) was used as materials for packaging mainly due to their thermal coefficient of expansion. The results, variation of tensometric bridge in the range between -5 mV to +5 mV at 10 VDC power supply shows that the packaging solution can be applied for MEMS packaging.|
|Source Title:||Proceedings of SPIE - The International Society for Optical Engineering|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Jul 10, 2018
WEB OF SCIENCETM
checked on May 30, 2018
checked on Jun 29, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.