Please use this identifier to cite or link to this item: https://doi.org/10.1109/ICSENS.2005.1597639
Title: Orthogonal fluxgate effect in electroplated wires
Authors: Ripka, P.
Li, X.P. 
Fan, J. 
Issue Date: 2005
Source: Ripka, P.,Li, X.P.,Fan, J. (2005). Orthogonal fluxgate effect in electroplated wires. Proceedings of IEEE Sensors 2005 : 69-72. ScholarBank@NUS Repository. https://doi.org/10.1109/ICSENS.2005.1597639
Abstract: Orthogonal fluxgate sensor was built using copper wire covered by electroplated permalloy. This type of sensor core has significant advantage over the sensors based on amorphous wires: it has no magnetic material in the central part, where the excitation field is low. 11 μV/nT sensitivity and less than 1 μT perming error were achieved for the first sensor prototype. The used core geometry also allows to measure both longitudinal and circumferencial hysteresis curves, which is important for further development. © 2005 IEEE.
Source Title: Proceedings of IEEE Sensors
URI: http://scholarbank.nus.edu.sg/handle/10635/73735
ISBN: 0780390563
DOI: 10.1109/ICSENS.2005.1597639
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

2
checked on Dec 13, 2017

Page view(s)

21
checked on Dec 9, 2017

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.