Please use this identifier to cite or link to this item: https://doi.org/10.1109/TCAPT.2002.803652
Title: Numerical simulation of the drop impact response of a portable electronic product
Authors: Lim, C.-T. 
Teo, Y.M.
Shim, V.P.W. 
Keywords: Drop impact
Finite element modeling
Mechanical fragility
Physical robustness
Portable electronic product
Issue Date: Sep-2002
Source: Lim, C.-T., Teo, Y.M., Shim, V.P.W. (2002-09). Numerical simulation of the drop impact response of a portable electronic product. IEEE Transactions on Components and Packaging Technologies 25 (3) : 478-485. ScholarBank@NUS Repository. https://doi.org/10.1109/TCAPT.2002.803652
Abstract: The ability of portable electronic products like cellular phones and personal digital assistants to withstand accidental impacts and shock is a valuable attribute consumers expect and manufacturers desire. Usually, manufacturers conduct expensive experimental drop tests to determine the fragility of such products during the product design cycle. An alternative to conducting drop tests is to perform numerical simulation. This paper examines the feasibility of studying the drop impact response of an electronic pager using a finite element software, ABAQUS/Explicit. Experimental drop test results are then used to compare with that of numerical simulation. Parameters examined include surface strains on pager housing and impact force. Comparisons show good correlation between experimental and numerical results. Finite element computation allows critical impact orientations and drop heights to be identified so that selective experimental drop tests can be performed to determine the actual physical robustness of these products.
Source Title: IEEE Transactions on Components and Packaging Technologies
URI: http://scholarbank.nus.edu.sg/handle/10635/73700
ISSN: 15213331
DOI: 10.1109/TCAPT.2002.803652
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