Please use this identifier to cite or link to this item:
https://doi.org/10.1117/12.425353
DC Field | Value | |
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dc.title | Determining the most likely site and mode of thermomechanical failure in multi-material systems | |
dc.contributor.author | Tay, A.A.O. | |
dc.contributor.author | Lee, K.H. | |
dc.contributor.author | Zhou, W. | |
dc.contributor.author | Lim, K.M. | |
dc.date.accessioned | 2014-06-19T05:33:50Z | |
dc.date.available | 2014-06-19T05:33:50Z | |
dc.date.issued | 2001 | |
dc.identifier.citation | Tay, A.A.O., Lee, K.H., Zhou, W., Lim, K.M. (2001). Determining the most likely site and mode of thermomechanical failure in multi-material systems. Proceedings of SPIE - The International Society for Optical Engineering 4408 : 368-380. ScholarBank@NUS Repository. https://doi.org/10.1117/12.425353 | |
dc.identifier.issn | 0277786X | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/73330 | |
dc.description.abstract | A methodology for predicting sites and modes of thermomechanical failure in IC and MEMS packages is developed. Singular stress fields around several stress concentration locations in a typical plastic-encapsulated IC package are calculated using special variable-order singular boundary elements and the singular value decomposition method. The strain energy density distributions around all the stress concentration locations are then obtained from the singular stress fields and compared. The most likely failure site as the temperature of the package is raised is then determined as well as the likely modes of failure, ie interfacial delamination or cracking of mold compound. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1117/12.425353 | |
dc.source | Scopus | |
dc.subject | Stress singularity | |
dc.subject | Thermomechanical failure sites | |
dc.subject | Variable-order boundary element method | |
dc.type | Conference Paper | |
dc.contributor.department | MECHANICAL ENGINEERING | |
dc.description.doi | 10.1117/12.425353 | |
dc.description.sourcetitle | Proceedings of SPIE - The International Society for Optical Engineering | |
dc.description.volume | 4408 | |
dc.description.page | 368-380 | |
dc.description.coden | PSISD | |
dc.identifier.isiut | 000170487300042 | |
Appears in Collections: | Staff Publications |
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