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|Title:||Study on LED degradation using CL, EBIC and a two-diode parameter extraction model|
|Citation:||Xiao, H.,Liu, Y.Y.,Phang, J.C.H.,Chan, D.S.H.,Chim, W.K.,Yan, K.P. (1999). Study on LED degradation using CL, EBIC and a two-diode parameter extraction model. Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA : 180-184. ScholarBank@NUS Repository.|
|Abstract:||LED degradation was investigated using cathodoluminescence (CL), electron-beam-induced current (EBIC) and device parameter extraction using a two-diode model. After electrical stress, the non-radiative recombination current increases, and the electroluminescence (EL) intensity at constant current bias decreases. The average EBIC and CL intensities also decrease. There is a good correlation between CL, EL and EBIC measurements. The two-diode model can reasonably model the LED degradation behaviour.|
|Source Title:||Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA|
|Appears in Collections:||Staff Publications|
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