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https://scholarbank.nus.edu.sg/handle/10635/72952
| Title: | Study on LED degradation using CL, EBIC and a two-diode parameter extraction model | Authors: | Xiao, H. Liu, Y.Y. Phang, J.C.H. Chan, D.S.H. Chim, W.K. Yan, K.P. |
Issue Date: | 1999 | Citation: | Xiao, H.,Liu, Y.Y.,Phang, J.C.H.,Chan, D.S.H.,Chim, W.K.,Yan, K.P. (1999). Study on LED degradation using CL, EBIC and a two-diode parameter extraction model. Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA : 180-184. ScholarBank@NUS Repository. | Abstract: | LED degradation was investigated using cathodoluminescence (CL), electron-beam-induced current (EBIC) and device parameter extraction using a two-diode model. After electrical stress, the non-radiative recombination current increases, and the electroluminescence (EL) intensity at constant current bias decreases. The average EBIC and CL intensities also decrease. There is a good correlation between CL, EL and EBIC measurements. The two-diode model can reasonably model the LED degradation behaviour. | Source Title: | Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA | URI: | http://scholarbank.nus.edu.sg/handle/10635/72952 |
| Appears in Collections: | Staff Publications |
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