Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/72952
Title: Study on LED degradation using CL, EBIC and a two-diode parameter extraction model
Authors: Xiao, H.
Liu, Y.Y.
Phang, J.C.H. 
Chan, D.S.H. 
Chim, W.K. 
Yan, K.P.
Issue Date: 1999
Source: Xiao, H.,Liu, Y.Y.,Phang, J.C.H.,Chan, D.S.H.,Chim, W.K.,Yan, K.P. (1999). Study on LED degradation using CL, EBIC and a two-diode parameter extraction model. Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA : 180-184. ScholarBank@NUS Repository.
Abstract: LED degradation was investigated using cathodoluminescence (CL), electron-beam-induced current (EBIC) and device parameter extraction using a two-diode model. After electrical stress, the non-radiative recombination current increases, and the electroluminescence (EL) intensity at constant current bias decreases. The average EBIC and CL intensities also decrease. There is a good correlation between CL, EL and EBIC measurements. The two-diode model can reasonably model the LED degradation behaviour.
Source Title: Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
URI: http://scholarbank.nus.edu.sg/handle/10635/72952
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