Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/72556
Title: Degradation monitor for the light output of LEDs based on cathodoluminescence signals and junction ideality factor
Authors: Wittpahl, V.
Liu, Y.Y.
Chan, D.S.H. 
Chim, W.K. 
Phang, J.C.H. 
Balk, L.J.
Yan, K.P.
Issue Date: 1996
Source: Wittpahl, V.,Liu, Y.Y.,Chan, D.S.H.,Chim, W.K.,Phang, J.C.H.,Balk, L.J.,Yan, K.P. (1996). Degradation monitor for the light output of LEDs based on cathodoluminescence signals and junction ideality factor. Annual Proceedings - Reliability Physics (Symposium) : 188-194. ScholarBank@NUS Repository.
Abstract: A degradation monitor that allows the prediction of the light output degradation of light emitting diodes is described. This is based on the variation of the differential cathodoluminescence signal output to distinguish between `good' and `bad' devices. A corresponding method using the variation of the junction ideality factor during stressing is also described.
Source Title: Annual Proceedings - Reliability Physics (Symposium)
URI: http://scholarbank.nus.edu.sg/handle/10635/72556
ISSN: 00999512
Appears in Collections:Staff Publications

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