Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/72494
Title: Atomic and magnetic force microscopy imaging of thin-film recording heads
Authors: Chim, W.K. 
Keywords: atomic force microscopy
magnetic force microscopy
recording heads
scanning force microscope
scanning probe microscope
Issue Date: Sep-1995
Source: Chim, W.K. (1995-09). Atomic and magnetic force microscopy imaging of thin-film recording heads. Scanning 17 (5) : 306-311. ScholarBank@NUS Repository.
Abstract: Investigations on the use of the scanning probe microscope (SPM) in the atomic force microscopy (AFM) mode for topography imaging and the magnetic force microscopy (MFM) mode for magnetic imaging are presented for a thin- film recording head. Results showed that the SPM is suitable for imaging the surface profile of the recording head, determining the width of the pole gap region, and mapping the magnetic field patterns of the recording head excited under current bias conditions of different polarity. For the cobalt sputter- coated tips used in MFM imaging, it was found that the magnetic field patterns obtained under different polarities of the current bias to the recording head were similar. This can be explained by the nature of the thin- film MFM tip, in which the direction of the tip magnetic moment can follow the stray magnetic field of the sample as the current bias to the recording head reverses in direction.
Source Title: Scanning
URI: http://scholarbank.nus.edu.sg/handle/10635/72494
ISSN: 01610457
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

Page view(s)

12
checked on Dec 16, 2017

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.