Statistical procedure for defect control in high quality manufacturing

Abstract

Advanced technologies today are such that it is possible to keep the occurrence of defects in manufactured products at very low levels. The use of the conventional c-chart for statistical control of defects in high quality products would encounter serious practical difficulties because the small number of defects would render invalid the assumptions behind the construction of the chart. Based on reasoning with fundamental probability distributions, this paper offers a reliable solution that is particularly suited to on-line inspection and testing operations such as those found in an automated manufacturing environment.