Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/72376
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dc.titlePlanning multiple levels constant stress accelerated life tests
dc.contributor.authorTang, L.-C.
dc.contributor.authorYang, G.
dc.date.accessioned2014-06-19T04:54:13Z
dc.date.available2014-06-19T04:54:13Z
dc.date.issued2002
dc.identifier.citationTang, L.-C.,Yang, G. (2002). Planning multiple levels constant stress accelerated life tests. Proceedings of the Annual Reliability and Maintainability Symposium : 338-342. ScholarBank@NUS Repository.
dc.identifier.issn0149144X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/72376
dc.description.abstractWe propose a method for planning constant stress accelerated life tests (CSALT) in which the departure from the usual optimality criterion can be quantified. The scheme is illustrated using three stress levels CSALT. In particular, a contour plot is developed to provide the solution space for sample allocation at high stress and the two lower stress levels. Based on the output from the contour plot, three related approaches for planning CSALT are then presented. Finally, a numerical example is used to illustrate the procedures.
dc.sourceScopus
dc.subjectAccelerated testing
dc.subjectConstrained optimization
dc.subjectContour plot
dc.typeConference Paper
dc.contributor.departmentINDUSTRIAL & SYSTEMS ENGINEERING
dc.description.sourcetitleProceedings of the Annual Reliability and Maintainability Symposium
dc.description.page338-342
dc.description.codenPRMSC
dc.identifier.isiutNOT_IN_WOS
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