Please use this identifier to cite or link to this item: https://doi.org/10.1109/RAMS.2007.328064
DC FieldValue
dc.titleEfficient reliability predictions of particle-induced failures in HDDs
dc.contributor.authorTang, L.-C.
dc.contributor.authorLam, S.-W.
dc.contributor.authorNg, Q.-Y.
dc.contributor.authorGoh, J.-S.
dc.date.accessioned2014-06-19T04:53:41Z
dc.date.available2014-06-19T04:53:41Z
dc.date.issued2007
dc.identifier.citationTang, L.-C.,Lam, S.-W.,Ng, Q.-Y.,Goh, J.-S. (2007). Efficient reliability predictions of particle-induced failures in HDDs. 2007 Proceedings - Annual Reliability and Maintainability Symposium, RAMS : 259-264. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/RAMS.2007.328064" target="_blank">https://doi.org/10.1109/RAMS.2007.328064</a>
dc.identifier.isbn0780397665
dc.identifier.issn0149144X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/72328
dc.description.abstractIn this paper, an experimental set-up as well as the modeling framework for efficient prediction of hard disks (HDD) reliability due to particle-induced failure within the product development process (PDP) is proposed. An alternative response using the cumulative particle counts (CPC), whose failure distribution can be modeled by the lognormal distribution, is introduced in the modeling framework. By using a model to describe the growth of CPC in prime HDDs based on data from the same vintage, the lifetime distribution of particle-induced failure for the HDDs can be obtained. Prime HDDs are fully functional drives within a typical HDD product development process. For illustration, five prime HDDs from a same vintage of a HDD family are used to determine the baseline CPC growth over a certain period of time. The lifetime distribution is then derived for that vintage of HDDs. © 2007 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/RAMS.2007.328064
dc.sourceScopus
dc.subjectAccelerated life testing
dc.subjectHard disk drive
dc.subjectReliability prediction
dc.typeConference Paper
dc.contributor.departmentINDUSTRIAL & SYSTEMS ENGINEERING
dc.description.doi10.1109/RAMS.2007.328064
dc.description.sourcetitle2007 Proceedings - Annual Reliability and Maintainability Symposium, RAMS
dc.description.page259-264
dc.identifier.isiutNOT_IN_WOS
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