Please use this identifier to cite or link to this item:
|Title:||The fabrication of TiNi thin films by pulsed-laser deposition|
Shape memory alloy
|Citation:||Chen, X., Lu, Y., Ren, Z., Zhu, S. (2002). The fabrication of TiNi thin films by pulsed-laser deposition. Proceedings of SPIE - The International Society for Optical Engineering 4426 : 225-228. ScholarBank@NUS Repository. https://doi.org/10.1117/12.456841|
|Abstract:||TiNi shape memory alloy (SMA) thin films have been fabricated by pulsed-laser deposition (PLD) at different substrate temperatures. The stoichiometry, surface morphology and crystallinity of the films were characterized by X-ray photoelectron spectroscopy (XPS), atomic force microscope (AFM) and X-ray diffraction (XRD). The transformation behaviour and crystallization temperatures were investigated by differential scanning calorimetry (DSC). It is found that the Ni content of the deposited films ranges from 46.7 to 52.0 at.%. The films deposited at low temperature are amorphous. The crystallization temperature of the Ti-51.5 at.% Ni thin film is 449°C. The martensitic transformation temperature of the film is -20.8°C.|
|Source Title:||Proceedings of SPIE - The International Society for Optical Engineering|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Mar 17, 2019
WEB OF SCIENCETM
checked on Mar 6, 2019
checked on Dec 22, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.