Please use this identifier to cite or link to this item: https://doi.org/10.1109/IRPS.2010.5488781
Title: SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cells
Authors: Meng, L.
Nagalingam, D. 
Bhatia, C.S. 
Street, A.G.
Phang, J.C.H. 
Keywords: EBIC
Electrical defects
Electron Beam Induced Current
Morphological defects
Scanning Electron Acoustic Microscopy
SEAM
Solar cell
Issue Date: 2010
Citation: Meng, L., Nagalingam, D., Bhatia, C.S., Street, A.G., Phang, J.C.H. (2010). SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cells. IEEE International Reliability Physics Symposium Proceedings : 503-507. ScholarBank@NUS Repository. https://doi.org/10.1109/IRPS.2010.5488781
Abstract: Morphological and electrical defects in solar cells are distinguished by combining Scanning Electron Acoustic Microscopy (SEAM) and Electron Beam Induced Current (EBIC) techniques. These techniques provide complementary information on grain boundaries and defects that affect solar cell performance in different ways. © 2010 IEEE.
Source Title: IEEE International Reliability Physics Symposium Proceedings
URI: http://scholarbank.nus.edu.sg/handle/10635/71719
ISBN: 9781424454310
ISSN: 15417026
DOI: 10.1109/IRPS.2010.5488781
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