Please use this identifier to cite or link to this item:
|Title:||SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cells|
Electron Beam Induced Current
Scanning Electron Acoustic Microscopy
|Citation:||Meng, L., Nagalingam, D., Bhatia, C.S., Street, A.G., Phang, J.C.H. (2010). SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cells. IEEE International Reliability Physics Symposium Proceedings : 503-507. ScholarBank@NUS Repository. https://doi.org/10.1109/IRPS.2010.5488781|
|Abstract:||Morphological and electrical defects in solar cells are distinguished by combining Scanning Electron Acoustic Microscopy (SEAM) and Electron Beam Induced Current (EBIC) techniques. These techniques provide complementary information on grain boundaries and defects that affect solar cell performance in different ways. © 2010 IEEE.|
|Source Title:||IEEE International Reliability Physics Symposium Proceedings|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Oct 12, 2018
WEB OF SCIENCETM
checked on Oct 3, 2018
checked on Oct 6, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.