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|Title:||SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cells|
Electron Beam Induced Current
Scanning Electron Acoustic Microscopy
|Citation:||Meng, L., Nagalingam, D., Bhatia, C.S., Street, A.G., Phang, J.C.H. (2010). SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cells. IEEE International Reliability Physics Symposium Proceedings : 503-507. ScholarBank@NUS Repository. https://doi.org/10.1109/IRPS.2010.5488781|
|Abstract:||Morphological and electrical defects in solar cells are distinguished by combining Scanning Electron Acoustic Microscopy (SEAM) and Electron Beam Induced Current (EBIC) techniques. These techniques provide complementary information on grain boundaries and defects that affect solar cell performance in different ways. © 2010 IEEE.|
|Source Title:||IEEE International Reliability Physics Symposium Proceedings|
|Appears in Collections:||Staff Publications|
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