Please use this identifier to cite or link to this item: https://doi.org/10.1109/APMC.2009.5384332
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dc.titleScattering characteristics from conducting cylinder with reconstructing electromagnetic cloaking layers
dc.contributor.authorYao, H.-Y.
dc.contributor.authorQiu, C.-W.
dc.contributor.authorLi, L.-W.
dc.date.accessioned2014-06-19T03:26:52Z
dc.date.available2014-06-19T03:26:52Z
dc.date.issued2009
dc.identifier.citationYao, H.-Y.,Qiu, C.-W.,Li, L.-W. (2009). Scattering characteristics from conducting cylinder with reconstructing electromagnetic cloaking layers. APMC 2009 - Asia Pacific Microwave Conference 2009 : 960-963. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/APMC.2009.5384332" target="_blank">https://doi.org/10.1109/APMC.2009.5384332</a>
dc.identifier.isbn9781424428021
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/71709
dc.description.abstractAs we know, some anisotropic materials are difficult to be realized in the practical synthesis and applications. However, the previously reported optimized EM cloaking are homogeneous anisotropic layers. Moreover, the performance of the EM cloaking shell will be decreased if strictly requiring the optimized value of material parameters. In this paper, a material reconstruction method is used to resolve this problem. Here, a conducting cylindrical structure with multi-layered electromagnetic (EM) cloaking shell is studied. A set of optimized anisotropic material parameters for the cloaking is used to reconstruct the homogeneous isotropic cloaking layers with alternately arranging the two kinds of dielectrics. The corresponding parameters in the reconstruction, such as the thickness and the number of layers, are discussed. Moreover, the losses of influence and the sensitivity of the perturbation for material parameters are investigated. ©2009 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/APMC.2009.5384332
dc.sourceScopus
dc.subjectElectromagnetic cloaking
dc.subjectIsotropic materials
dc.subjectLosses
dc.subjectMultilayer
dc.subjectScattering cross section
dc.subjectSensitivity
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.contributor.departmentTEMASEK LABORATORIES
dc.description.doi10.1109/APMC.2009.5384332
dc.description.sourcetitleAPMC 2009 - Asia Pacific Microwave Conference 2009
dc.description.page960-963
dc.identifier.isiutNOT_IN_WOS
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