MFM study of magnetic bit patterns of different dimensions
You, D. Zheng, Y. Liu, Z. Guo, Z. Wu, Y.
You, D.
Zheng, Y.
Liu, Z.
Guo, Z.
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Abstract
The magnetic force microscopy (MFM) was used to study the magnetic property of each bit and the interaction between the transitions created by the discontinuity of magnetization at the edges of bits. The single domain structures were formed as the bit dimension was reduced to 200 nm or less. The interplay between the magnetostatic energy and exchange energy for the patterned media bits was demonstrated.
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Digests of the Intermag Conference
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Date
2002
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Conference Paper