Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.egypro.2012.02.020
Title: Line-imaging spectroscopy for characterisation of silicon wafer solar cells
Authors: Peloso, M.P.
Lew, J.S.
Hoex, B. 
Aberle, A.G. 
Keywords: Electroluminescence
Hyper-spectral imaging
Instrumentation
Line-imaging spectroscopy
Solar cell
Issue Date: 2012
Source: Peloso, M.P., Lew, J.S., Hoex, B., Aberle, A.G. (2012). Line-imaging spectroscopy for characterisation of silicon wafer solar cells. Energy Procedia 15 : 171-178. ScholarBank@NUS Repository. https://doi.org/10.1016/j.egypro.2012.02.020
Abstract: Line-imaging spectroscopy can be applied to enable the extraction of the luminescence spectrum at each point on a solar cell. The resulting hyperspectral image of luminescence may characterise the photovoltaic material or device. In this paper, a line-imaging instrument which can perform spatially resolved luminescence spectroscopy on silicon wafer solar cells is investigated. The instrument is applied to analyse a textured and an untextured multicrystalline silicon wafer solar cell. Detectable differences in the luminescence spectrum are observed. © 2011 Published by Elsevier Ltd.
Source Title: Energy Procedia
URI: http://scholarbank.nus.edu.sg/handle/10635/70805
ISSN: 18766102
DOI: 10.1016/j.egypro.2012.02.020
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