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https://doi.org/10.1016/j.egypro.2012.02.020
Title: | Line-imaging spectroscopy for characterisation of silicon wafer solar cells | Authors: | Peloso, M.P. Lew, J.S. Hoex, B. Aberle, A.G. |
Keywords: | Electroluminescence Hyper-spectral imaging Instrumentation Line-imaging spectroscopy Solar cell |
Issue Date: | 2012 | Citation: | Peloso, M.P., Lew, J.S., Hoex, B., Aberle, A.G. (2012). Line-imaging spectroscopy for characterisation of silicon wafer solar cells. Energy Procedia 15 : 171-178. ScholarBank@NUS Repository. https://doi.org/10.1016/j.egypro.2012.02.020 | Abstract: | Line-imaging spectroscopy can be applied to enable the extraction of the luminescence spectrum at each point on a solar cell. The resulting hyperspectral image of luminescence may characterise the photovoltaic material or device. In this paper, a line-imaging instrument which can perform spatially resolved luminescence spectroscopy on silicon wafer solar cells is investigated. The instrument is applied to analyse a textured and an untextured multicrystalline silicon wafer solar cell. Detectable differences in the luminescence spectrum are observed. © 2011 Published by Elsevier Ltd. | Source Title: | Energy Procedia | URI: | http://scholarbank.nus.edu.sg/handle/10635/70805 | ISSN: | 18766102 | DOI: | 10.1016/j.egypro.2012.02.020 |
Appears in Collections: | Staff Publications |
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